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Izvestiya of Saratov University.
Physics
ISSN 1817-3020 (Print)
ISSN 2542-193X (Online)
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Effect of nitrogen pressure on the composition and structure of thin films GaAs1 – x – yNxBiy
Application of Thin Film Structures Based on Amorphous Silicon for pH Measurements in Solutions
Calculation of Thermal Parameters and Technology of Formation MPL Microwave Range
Influence of Sm Impurity Atoms on the Switching Effect in Thin Films of GeS
Electric and Magnetic-Field-Induced Formation of Macrostructures in Ferroelectric Liquid Crystals
Influence of Argon Pressure on Texture and Microstructure of Cobalt Films Produced by Dc-Sputtering
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